IEC 60747-5-10:2019 半导体器件第5-10部分:光电子器件发光二极管基于室温基准点的内部量子效率试验方法

标准编号：IEC 60747-5-10:2019

中文名称：半导体器件第5-10部分:光电子器件发光二极管基于室温基准点的内部量子效率试验方法

英文名称：Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point

发布日期：2019-12-11

标准范围

IEC 60747-5-10:2019（E）规定了单个发光二极管（LED）芯片或无磷光体封装内部量子效率（IQE）的测量方法。用于照明应用的白色LED不在本文件范围内。本文件仅使用在操作室温度下测量的相对外部量子效率（EQE）。为了识别参考IQE，找到了对应于100%注入效率的工作电流，辐射效率由该点相对EQE的微小变化确定。IQE作为电流的函数，然后根据EQE与参考点处的值的相对比率来计算，这被称为室温参考点法（RTRM）。

IEC 60747-5-10:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes only the relative external quantum efficiency (EQE) measured at an operating room temperature. In order to identify the reference IQE, an operating current corresponding to the injection efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal change of the relative EQE at that point. The IQE as a function of current is then calculated from the relative ratio of the EQEs to the value at the reference point, which is called room-temperature reference-point method (RTRM).

标准预览图