IEC 62779-2:2016 半导体器件 - 用于人体通信的半导体接口 - 第2部分:接口性能的表征

标准编号：IEC 62779-2:2016

中文名称：半导体器件 - 用于人体通信的半导体接口 - 第2部分:接口性能的表征

英文名称：Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances

发布日期：2016-02-18

标准范围

IEC 62779-2:2016定义了构成人体通信（HBC）半导体接口的电极电气性能的测量方法。在该测量方法中，信号发射器与信号接收器电隔离，因此发射器与接收器之间保持隔离状态，以准确测量电极的性能。本部分包括测量方法的一般规范和功能规范。

IEC 62779-2:2016 defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). In the measurement method, a signal transmitter is electrically isolated from a signal receiver, so an isolation condition between the transmitter and receiver is maintained to accurately measure the electrode's performances. This part includes general and functional specifications of the measurement method.

标准预览图