DIN 50451-1:2003-04 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

标准编号：DIN 50451-1:2003-04

英文标题：Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

德文标题：Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Elementspuren in Flüssigkeiten - Teil 1: Silber (Ag), Gold (Au), Calcium (Ca), Kupfer (Cu), Eisen (Fe), Kalium (K) und Natrium (Na) in Salpetersäure mittels AAS

发布日期：2003-04

DIN 50451-1:2003-04 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

标准预览图