DIN 50445:1992-04 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers

标准编号：DIN 50445:1992-04

英文标题：Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers

德文标题：Prüfung von Materialien für die Halbleitertechnologie; Kontaktlose Messung des spezifischen elektrischen Widerstandes mit dem Wirbelstrom-Verfahren; Homogen dotierte Halbleiterscheiben

发布日期：1992-04

DIN 50445:1992-04 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers

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