DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

标准编号：DIN SPEC 52407:2015-03

英文标题：Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

德文标题：Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM)

发布日期：2015-03

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

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