DIN EN IEC 63364-1:2023-10 - Draft Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021

标准编号：DIN EN IEC 63364-1:2023-10 - Draft

英文标题：Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021

德文标题：Halbleiterbauelemente - Halbleiterbauelemente für IOT-Systeme - Teil 1: Prüfverfahren für die Erkennung von Schallschwankungen (IEC 47/2742/CDV:2021); Deutsche und Englische Fassung prEN IEC 63364-1:2021

发布日期：2023-10

DIN EN IEC 63364-1:2023-10 - Draft Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021

标准预览图