DIN 50431:1988-05 Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array

标准编号：DIN 50431:1988-05

英文标题：Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array

德文标题：Prüfung von Materialien für die Halbleitertechnologie; Messung des spezifischen elektrischen Widerstandes von Einkristallen aus Silicium oder Germanium mit dem Vier-Sonden-Gleichstrom-Verfahren bei linearer Anordnung der Sonden

发布日期：1988-05

DIN 50431:1988-05 Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array

标准预览图