DIN 50440:1998-11 Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method

标准编号：DIN 50440:1998-11

英文标题：Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method

德文标题：Prüfung von Materialien für die Halbleitertechnologie - Messung der Trägerlebensdauer in Silicium-Einkristallen - Rekombinations-Trägerlebensdauer bei geringer Injektion nach dem Photoleitfähigkeitsverfahren

发布日期：1998-11

DIN 50440:1998-11 Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method

标准预览图