DIN EN 60749-11:2003-04 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002

标准编号：DIN EN 60749-11:2003-04

英文标题：Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002

德文标题：Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 11: Rascher Temperaturwechsel; Zweibäderverfahren (IEC 60749-11:2002); Deutsche Fassung EN 60749-11:2002

发布日期：2003-04

DIN EN 60749-11:2003-04 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002

标准预览图