IEC 61788-4:2020 超导性 - 第4部分:残余电阻率测量 - Nb-Ti和Nb3sn复合超导体的残余电阻比

标准编号：IEC 61788-4:2020

中文名称：超导性 - 第4部分:残余电阻率测量 - Nb-Ti和Nb3sn复合超导体的残余电阻比

英文名称：Superconductivity - Part 4: Residual resistance ratio measurement - Residual resistance ratio of Nb-Ti and Nb3Sn composite superconductors

发布日期：2020-03-20

标准范围

IEC 61788-4:20 20作为IEC 61788-4:20 20 RLV提供，其中包含国际标准及其红线版本，显示了与上一版本相比技术内容的所有变化。IEC 61788-4:20 20规定了在无应变条件和零外部磁场下测定具有Cu、Cu-Ni、Cu/Cu-Ni和Al基体的Nb-Ti和Nb3Sn复合超导体的剩余电阻比（RRR）的测试方法。该方法旨在用于具有矩形或圆形横截面的整体结构、RRR值小于350且横截面面积小于3mm2的超导体样品。在Nb3Sn的情况下，样品已经接受了反应热处理。这第五版取消并取代了2016年出版的第四版。本版构成技术修订版。与上一版相比，此版本包括以下重大技术变更:a)样品上用于可靠测量的电压抽头的合适距离的变化，b)证明本标准中测量方法有效性的Nb3Sn超导体剩余电阻比循环试验结果的新报告，c)修订铜比率和铜分数的混淆定义。

IEC 61788-4:2020 is available as IEC 61788-4:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61788-4:2020 specifies a test method for the determination of the residual resistance ratio (RRR) of Nb-Ti and Nb3Sn composite superconductors with Cu, Cu-Ni, Cu/Cu-Ni and Al matrix in a strain-free condition and zero external magnetic field. This method is intended for use with superconductor specimens that have a monolithic structure with rectangular or round cross-section, RRR value less than 350, and cross-sectional area less than 3 mm2. In the case of Nb3Sn, the specimens have received a reaction heat-treatment. This fifth edition cancels and replaces the fourth edition published in 2016. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) change in the suitable distance of voltage taps on the specimen for reliable measurement,
b) new report on the result of the round robin test of the residual resistance ratio of Nb3Sn superconductors that proves the validity of the measurement method in this standard,
c) revision of the confusing definitions of the copper ratio and copper fraction.

标准预览图