IEC TS 62607-8-1:2020 纳米制造.关键控制特性.第8-1部分:纳米金属氧化物界面器件.用热刺激电流测定缺陷状态的试验方法

标准编号：IEC TS 62607-8-1:2020

中文名称：纳米制造.关键控制特性.第8-1部分:纳米金属氧化物界面器件.用热刺激电流测定缺陷状态的试验方法

英文名称：Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current

发布日期：2020-04-09

标准范围

IEC TS 62607-8-1:20 20有两种类型的热刺激电流（TSC）测量方法，按电流的来源分类。一种是通过电荷的去俘获产生的。另一个是由去极化产生的。IEC TS 62607-8-1:20 20侧重于前一种方法，并指定了用于确定纳米使能的金属-氧化物界面器件的缺陷状态的测量方法。IEC TS 62607-8-1:20 20包括:-用于测量TSC的实验程序的概述，-解释结果和讨论数据分析的方法，以及-案例研究。

IEC TS 62607-8-1:2020 There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
IEC TS 62607-8-1:2020 includes:
– outlines of the experimental procedures used to measure TSC,
– methods of interpretation of results and discussion of data analysis, and
– case studies.

标准预览图