IEC 62132-1:2015 集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

标准编号：IEC 62132-1:2015

中文名称：集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

英文名称：Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

发布日期：2015-10-29

标准范围

IEC 62132-1:20 15提供了关于集成电路（IC）对传导和辐射干扰的电磁抗扰度测量的一般信息和定义。它还定义了IEC 62132系列所有部件的一般测试条件、测试设备和设置，以及测试程序和测试报告的内容。附件A中包含了测试方法比较表，以帮助选择适当的测量方法。与上一版相比，此版本包括以下重大技术变更:a)从标题中删除了150 kHz至1 GHz的频率范围；b)在7.4.1的表2中增加了高于1GHz的频率阶跃；c)修改了8.3中的IC性能等级；d)表A.1分为两个表，并在附录A的新表A.2中增加了对IEC 62132-8和IEC 62132-9的引用。

IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 1 GHz has been deleted from the title;
b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;
c) IC performance classes in 8.3 have been modified;
d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.

标准预览图