IEC TS 62804-1-1:2020 光伏组件.潜在诱发退化检测的试验方法.第1-1部分:晶体硅.分层

标准编号：IEC TS 62804-1-1:2020

中文名称：光伏组件.潜在诱发退化检测的试验方法.第1-1部分:晶体硅.分层

英文名称：Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1-1: Crystalline silicon - Delamination

发布日期：2020-01-10

标准范围

IEC 62804-1-1:2020规定了测试和评估晶体硅光伏组件层压板（主要是具有一个或两个玻璃面）中潜在诱导退化分层（PID-d）模式的程序。本文件评估了可归因于接地和模块单元电路之间电流传输的分层。本试验旨在驱动分层的因素包括与湿热暴露、界面处的钠积累、电池电路中的阴极气体析出、金属化以及光伏组件内由电压电位激活的其他组件相关的附着力降低。本范围不考虑与施加的应力因素（IEC TS 62804-1的权限）相关的晶体硅光伏组件功率变化。

IEC 62804-1-1:2020 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules-principally those with one or two glass faces. This document evaluates delamination attributable to current transfer between ground and the module cell circuit. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope.

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