IEC 60749-5:2017 半导体器件.机械和气候试验方法.第5部分:稳态温湿度偏寿命试验

标准编号：IEC 60749-5:2017

中文名称：半导体器件.机械和气候试验方法.第5部分:稳态温湿度偏寿命试验

英文名称：Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

发布日期：2017-04-10

标准范围

IEC 60749-5:20 17提供了稳态温度和湿度偏置寿命测试，目的是评估非密封封装固态器件在潮湿环境中的可靠性。这第二版取消并取代了2003年出版的第一版。本版构成技术修订版。与上一版相比，此版本包括以下重大技术变更:a)校正方程中的误差；b)列入指导说明；c)试验条件适用性的澄清。

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.

标准预览图