IEC 60747-1:2006 半导体器件 - 第1部分:总则

标准编号：IEC 60747-1:2006

中文名称：半导体器件 - 第1部分:总则

英文名称：Semiconductor devices - Part 1: General

发布日期：2006-02-21

标准范围

IEC 60747-1:20 06给出了适用于IEC 60747和IEC 60748其他部分所涵盖的分立半导体器件和集成电路的一般要求（见附录A）。IEC 60747-1的第二版取消并取代了第一版(1983)及其修正案1(1991)、2(1993)和3(1996)。与上一版相比的主要变化如下:a)省略了IEV中现在给出的术语（或与IEV冲突的术语）。b)对基本评级和特征指南进行了全面修订。c)通用测量方法和参考测量方法之间的区别已被删除。d)增加了关于产品停产通知的条款。

IEC 60747-1:2006 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This second edition of IEC 60747-1 cancels and replaces the first edition (1983) and its amendments 1 (1991), 2 (1993) and 3 (1996). The main changes with respect to the previous edition are listed below:
a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted.
b) There has been a general revision of guidance on essential ratings and characteristics.
c) The distinction between general and reference methods of measurement has been removed.
d) A clause on product discontinuation notice has been added.

标准预览图