IEC TS 62607-3-3:2020 纳米制造.关键控制特性.第3-3部分:发光纳米材料.用时间相关单光子计数法（TCSPC）测定半导体量子点的荧光寿命

标准编号：IEC TS 62607-3-3:2020

中文名称：纳米制造.关键控制特性.第3-3部分:发光纳米材料.用时间相关单光子计数法（TCSPC）测定半导体量子点的荧光寿命

英文名称：Nanomanufacturing - Key control characteristics - Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC)

发布日期：2020-09-24

标准范围

技术规范IEC 62607:2020提供了一种使用时间相关单光子计数(TCSPC)技术确定半导体量子点(QD)的荧光寿命的方法。TCSPC适用于测试皮秒到纳秒范围内的荧光寿命。本文件仅适用于作为QDs稳定分散体的液体样品。它不适用于固体样品。本文件包括:-实验程序概要，-数据处理，以及-案例研究。

IEC 62607:2020, a Technical Specification, provides a method for determining the fluorescence lifetime of semiconductor quantum dots (QDs) using the time correlated single photon counting (TCSPC) technique. TCSPC is suitable for testing fluorescence lifetime in the range from picoseconds to nanoseconds. This document is only applicable to liquid samples that are stable dispersions of QDs. It is not applicable to solid samples.
This document includes:
– outlines of the experimental procedures,
– data processing, and
– case study.

标准预览图