IEC TS 62607-5-1:2014 纳米制造关键控制特性第5-1部分:薄膜有机/纳米电子器件载流子传输测量

标准编号：IEC TS 62607-5-1:2014

中文名称：纳米制造关键控制特性第5-1部分:薄膜有机/纳米电子器件载流子传输测量

英文名称：Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements

发布日期：2014-09-03

标准范围

IEC TS 62607-5-1:2014（E）提供了表征薄膜有机/纳米电子器件电荷传输特性的标准化样品结构，以及报告结构细节的格式，该结构应与测量结果一起提供。具有接触面积受限掺杂的标准化OTFT测试结构可以降低接触电阻，并实现电荷载流子迁移率的可靠测量。本技术规范的目的是提供测试样品结构，用于测定有机薄膜器件的固有电荷传输特性。其目的是为OTFTs提供可靠的材料信息，并为制作试样结构制定指导方针，以便材料信息在整个研究社区和行业中清晰一致。

IEC TS 62607-5-1:2014(E) provides a standardized sample structure for characterizing charge transport properties in thin-film organic/nano electronic devices and a format to report details of the structure which shall be provided with the measurement results. The standardized OTFT testing structure with a contact-area-limited doping can mitigate contact resistance and enable reliable measurement of the charge carrier mobility. The purpose of this Technical Specification is to provide test sample structures for determining the intrinsic charge transport properties of organic thin-film devices. The intention is to provide reliable materials information for OTFTs and to set guidelines for making test sample structures so that materials information is clear and consistent throughout the research community and industry.

标准预览图