IEC 60747-5-8:2019 半导体器件第5-8部分:光电子器件发光二极管发光二极管光电效率试验方法

标准编号：IEC 60747-5-8:2019

中文名称：半导体器件第5-8部分:光电子器件发光二极管发光二极管光电效率试验方法

英文名称：Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes

发布日期：2019-11-13

标准范围

IEC 60747-5-8:2019规定了无磷光体的单个发光二极管（LED）芯片或封装的各种效率的术语和测量方法。照明应用的白色LED不在IEC 60747本部分的范围内。本部分定义的测量方法包括功率效率（PE）、外部量子效率（EQE）、电压效率（VE）和光提取效率（LEE）。为了测量LEE，使用了内部量子效率（IQE）的测量数据，其测量方法在IEC 60747中进行了讨论-5-9和IEC 60747-5-10。注入效率（IE）和辐射效率（RE）仅给出定义。

IEC 60747-5-8:2019 specifies the terminology and the measuring methods of various efficiencies of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this part of IEC 60747. The efficiencies whose measuring methods are defined in this part are the power efficiency (PE), the external quantum efficiency (EQE), the voltage efficiency (VE), and the light extraction efficiency (LEE). To measure the LEE, the measurement data of the internal quantum efficiency (IQE) is used, whose measuring method is discussed in IEC 60747-5-9 and IEC 60747-5-10. The injection efficiency (IE) and the radiative efficiency (RE) are given definitions only.

标准预览图