IEC TS 62607-6-14:2020 纳米制造.关键控制特性.第6-14部分:石墨烯基材料.缺陷水平:拉曼光谱

标准编号：IEC TS 62607-6-14:2020

中文名称：纳米制造.关键控制特性.第6-14部分:石墨烯基材料.缺陷水平:拉曼光谱

英文名称：Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

发布日期：2020-10-27

标准范围

IEC TS 62607-6-14:2020建立了确定结构关键控制特性的标准化方法？缺陷等级对于由石墨烯基材料组成的粉末？拉曼光谱。缺陷能级由拉曼光谱中D+D’带和2D带的强度比ID+D’/I2D导出。？根据本文件确定的缺陷水平将被列为石墨烯粉末的空白详细规范IEC 62565-3-1中的关键控制特性。？该方法适用于石墨烯粉末或石墨烯基材料，例如还原氧化石墨烯(rGO)、双层石墨烯、三层石墨烯和少层石墨烯。？典型的应用领域是石墨烯制造商的质量控制和分类，以及下游用户的产品选择。？如果石墨烯的物理形式是粉末，则本文所述的方法是合适的。

IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
？ defect level
for powders consisting of graphene-based material by
？ Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D.
？ The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
？ The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
？ Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
？ The method described in this document is appropriate if the physical form of graphene is powder.

标准预览图