IEC TS 62607-6-17:2023 纳米制造.关键控制特性.第6-17部分:石墨烯基材料.顺序参数:X射线衍射和透射电子显微镜

标准编号：IEC TS 62607-6-17:2023

中文名称：纳米制造.关键控制特性.第6-17部分:石墨烯基材料.顺序参数:X射线衍射和透射电子显微镜

英文名称：Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy

发布日期：2023-05-03

标准范围

IEC TS 62607-6-17:2023建立了通过X射线衍射（XRD）和透射电子显微镜确定石墨烯基材料和层状碳材料的关键控制特征序参数的标准化方法。从z轴和x-y轴两个角度分析了序参量。在z轴中，阶数参数由XRD光谱中峰(002)的半峰全宽(FWHM)导出。在x-y轴上，它是从对应于通过SAED（选区电子衍射）技术获得的衍射图案的峰（100）的FWHM导出的，该技术在世界上大多数透射电子显微镜上常规进行。该方法适用于石墨烯基材料和层状碳材料，包括石墨、膨胀石墨、无定形碳、玻璃状碳或玻璃状碳，其结构通过其他表征技术得以阐明。该方法适用于区分少层石墨烯或还原氧化石墨烯与层状碳材料。典型的应用领域是制造中的质量控制，以确保批次间的再现性。笔记？氧化石墨烯是石墨烯基材料的一种类型，不在本文档的范围内。

IEC TS 62607-6-17:2023 establishes a standardized method to determine the key control characteristic order parameter for graphene-based material and layered carbon material by X-ray diffraction (XRD) and transmission electron microscopy.
The order parameter is analysed from two perspectives: z-axis and x-y-axis. In the z-axis the order parameter is derived from the full width at half maximum (FWHM) of peak (002) in the XRD spectrum. In the x-y-axis, it is derived from the FWHM of peak (100) corresponding to diffraction patterns obtained by SAED (selected area electron diffraction) technique, which is routinely performed on most transmission electron microscopes in the world.
The method is applicable for graphene-based material and layered carbon material including graphite, expanded graphite, amorphous carbon, vitreous carbon or glassy carbon, the structures of which are clarified by other characterization techniques.
The method is applicable for differentiating few-layer graphene or reduced graphene oxide from layered carbon material.
Typical application area is quality control in manufacturing to ensure batch-to-batch reproducibility.
NOTE？Graphene oxide, one type of graphene-based material, is not within the scope of this document.

标准预览图