IEC 63287-1:2021 半导体器件.通用半导体鉴定指南.第1部分:IC可靠性鉴定指南
标准编号：IEC 63287-1:2021
中文名称：半导体器件.通用半导体鉴定指南.第1部分:IC可靠性鉴定指南
英文名称：Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
发布日期：2021-08-25
标准范围
IEC 63287-1:20 21给出了半导体集成电路产品可靠性鉴定计划的指南。本文件不适用于军事和空间相关应用。注1？制造商可以使用灵活的样本量来降低成本并保持合理的可靠性。如果有规定，基于EDR-4708、AEC Q100、JESD47或其他相关文件的本指南改编也可以适用。注2？本文采用的威布尔分布法是计算给定可靠性项目的适当样本量和试验条件的几种方法之一。IEC 63287-1第一版取消并取代了2017年发布的IEC 60749-43第一版。本版构成技术修订版。与上一版相比，此版本包括以下重大技术变更:该文件已重新命名和编号，以区别于IEC 60749（所有部分）；增加了一个关于“家庭”概念的新章节，并对现有案文进行了适当的重新编号。
IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.
NOTE 1？The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.
NOTE 2？The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
- the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);
- a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.
标准预览图
