IEC 62433-3:2017 EMC IC建模 - 第3部分:用于EMI行为模拟的集成电路模型 - 辐射发射建模（ICEM-RE）

标准编号：IEC 62433-3:2017

中文名称：EMC IC建模 - 第3部分:用于EMI行为模拟的集成电路模型 - 辐射发射建模（ICEM-RE）

英文名称：EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

发布日期：2017-01-27

标准范围

IEC 62433-3:20 17提供了一种用于导出宏模型以允许模拟集成电路(IC)的辐射发射水平的方法。该模型通常被称为集成电路发射模型-辐射发射，ICEM-RE。当测量或模拟数据不能直接导入仿真工具时，该模型旨在用于模拟完整的IC，包括或不包括其相关封装、模拟和数字IC（输入/输出引脚、数字内核和电源）的功能块和知识产权（IP）块。

IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE.  The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.

标准预览图