IEC 62951-8:2023 半导体器件.柔性和可拉伸半导体器件.第8部分:柔性电阻存储器的可拉伸性、柔性和稳定性的试验方法

标准编号：IEC 62951-8:2023

中文名称：半导体器件.柔性和可拉伸半导体器件.第8部分:柔性电阻存储器的可拉伸性、柔性和稳定性的试验方法

英文名称：Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

发布日期：2023-01-19

标准范围

IEC 62951-8:2023（E）定义了用于评估柔性电阻存储器的可拉伸性、柔性和稳定性的术语和测试方法。测试方法说明包括实验程序和使用的设备。它还包括测试环境温度和相对湿度等测试条件的一般要求。本文件中描述的测试方法侧重于稳定性评估，而不是可靠性。

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.

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