IEC 60747-5-4:2022 半导体器件第5-4部分:光电子器件半导体激光器
标准编号：IEC 60747-5-4:2022
中文名称：半导体器件第5-4部分:光电子器件半导体激光器
英文名称：Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
发布日期：2022-04-27
标准范围
IEC 60747-5-4:20 22(E)规定了半导体激光器的术语、基本额定值和特性以及测量方法。与上一版相比，此版本包括以下重大技术变更:与照明领域相关的术语和定义的参考文献IEC 60050-845基于IEC 60050-845:2020进行了修订；3.3.2中发射角改为辐射角；3.4.1中上升时间和下降时间的定义基于出版物IEC 60050-521:2002进行了修订；在第4条中，将光谱线宽添加到表1中；修改第4条中表1的载噪比条件。修正了5.2.2中载噪比方程中的错误；在5中增加了对用于载波噪声比测量的设备的注意事项。2.2;删除第一版5.3.2中关于小信号截止频率测量方法的说明，因为在最新版本的ISO 11554中已有定义；修订了5.4中的寿命参考文件；5.5.3中增加了针对用于半强度宽度和1/e2强度的测量布置的注意事项；附件A、附件B和附件C中的参考表按照ISO出版物的最新版本进行修订。
IEC 60747-5-4:2022(E) specifies the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
This edition includes the following significant technical changes with respect to the previous edition:
- References for the terms and definitions related to the lighting area, IEC 60050-845, are revised based on IEC 60050-845:2020;
- Emission angle is changed to radiation angle in 3.3.2;
- Definitions of rise time and fall time in 3.4.1 are revised based on the publication IEC 60050-521:2002;
- Spectral linewidth is added to Table 1 in Clause 4;
- Conditions for carrier-to-noise ratio of Table 1 in Clause 4 is amended.
- Error in the equation for carrier-to-noise ratio in 5.2.2 is corrected;
- Precaution against the equipment used for carrier-to-noise ratio measurement is added in 5.2.2;
- Explanation for the measurement method of the small signal cut-off frequency in 5.3.2 of the first edition is deleted because it has been defined in the latest version of ISO 11554;
- Reference document for the lifetime in 5.4 is amended;
- Precaution against the measuring arrangement used for the half-intensity width and 1/e2-intensity is added in 5.5.3;
- Reference tables in Annex A, Annex B and Annex C are revised by following the latest version of ISO publications.
标准预览图
