IEC TS 62804-2:2022 光伏（PV）组件.检测潜在诱发退化的试验方法.第2部分:薄膜

标准编号：IEC TS 62804-2:2022

中文名称：光伏（PV）组件.检测潜在诱发退化的试验方法.第2部分:薄膜

英文名称：Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film

发布日期：2022-03-29

标准范围

IEC TS 62804-2:20 22定义了测试和评估光伏（PV）模块对湿热环境中高压应力影响导致的功率损失（称为电位诱导退化（PID））的耐久性的设备和程序。本文件定义了一种测试方法，该方法将加速应力测试期间电压应力下有源电池电路和接地之间的库仑传输与室外测试期间的库仑传输进行比较，以确定PID的加速因子。该文件测试了涉及移动离子影响半导体吸收层上的电场或与薄膜电子相互作用从而影响模块功率的降解机制。

IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.

标准预览图