IEC TS 62607-5-4:2022 纳米制造.关键控制特性.第5-4部分:用电子能量损失光谱法（EELS）测量纳米材料的能带隙

标准编号：IEC TS 62607-5-4:2022

中文名称：纳米制造.关键控制特性.第5-4部分:用电子能量损失光谱法（EELS）测量纳米材料的能带隙

英文名称：Nanomanufacturing - Key control characteristics - Part 5-4: Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)

发布日期：2022-12-07

标准范围

IEC TS 62607-5-4:20 22规定了使用透射电子显微镜的电子能量损失数据测量纳米材料带隙能量的方法。本文件中规定的方法适用于半导体和绝缘纳米材料，以估计带隙。获得可靠数据的测量是在TEM观察和样品厚度一致的条件下进行的。带隙能量的适用测量范围大于2 eV。

IEC TS 62607-5-4:2022 specifies the measuring method of the band gap energy of a nanomaterial using electron energy loss data of transmission electron microscope.
The method specified in this document is applicable to semiconducting and insulating nanomaterials to estimate the band gap.
The measurement to get reliable data is performed under the consistent conditions of TEM observation and specimen thickness. The applicable measurement range of band gap energy is more than 2 eV.

标准预览图