IEC 62631-3-4:2019 固体绝缘材料的介电和电阻特性第3-4部分:电阻特性的测定（直流法）高温下的体积电阻和体积电阻率

标准编号：IEC 62631-3-4:2019

中文名称：固体绝缘材料的介电和电阻特性第3-4部分:电阻特性的测定（直流法）高温下的体积电阻和体积电阻率

英文名称：Dielectric and resistive properties of solid insulating materials - Part 3-4: Determination of resistive properties (DC methods) - Volume resistance and volume resistivity at elevated temperatures

发布日期：2019-03-28

标准范围

IEC 62631-3-4:20 19涵盖了通过施加DC电压和高达800°C的温度来测定绝缘材料的绝缘电阻和体积电阻率的程序。典型的应用材料包括高温云母板和氧化铝陶瓷。本版IEC 62631-3-4取消并取代了1971年出版的IEC 60345“绝缘材料高温下电阻和电阻率的测试方法”。本版构成技术修订版。此版本包括以下与IEC 60345相关的重大技术变更:修订后的标准成为IEC 62631-3-x系列的一部分。标准的标题发生了变化，并作为第3-4部分适应了该系列。增加第2条“规范性引用”、第3条“术语和定义”和第4条“意义”。增加子条款5.2“电源、电压”、5.3.1.2“试样数量”和5.3.1.3“试样的调节和预处理”。在5.3.5“测量过程中的特殊注意事项”中，修改了电流测量中的误差分析，并与IEC 62631-3-1保持一致。在6.2“逐步升温（方法B）”中，删除了一个以上试样的方法。用于测试和调节的标准大气条件，特别是温度，根据IEC 60212进行替换。对试验装置电路图进行了修改，在附录A中增加了试验装置的结构图和图片。部分条款的顺序进行了调整。

IEC 62631-3-4:2019 covers procedures for the determination of insulation resistance and volume resistivity of insulating materials by applying DC-voltage and temperatures up to 800 °C. The typical application materials include high temperature mica plate and alumina ceramics.
This edition of IEC 62631-3-4 cancels and replaces IEC 60345 “Method of test for electrical resistance and resistivity of insulating materials at elevated temperatures”, published in 1971. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to IEC 60345:

1. The revised standard becomes part of the series IEC 62631-3-x. Title of the standard is changed and adapted to the series as Part 3-4.
2. Clauses 2 "Normative references", 3 "Terms and definitions", and 4 "Significance" are added.
3. Subclauses 5.2 "Power supply, Voltage", 5.3.1.2 "Number of test specimens" and 5.3.1.3 "Conditioning and pre-treatment of test specimens" are added.
4. In 5.3.5 "Special precautions during measurements", errors analysis in the measurement of current are modified, and aligned with IEC 62631-3-1.
5. In 6.2 "Increasing the temperature by steps (method B)", the method for more than one specimen is removed.
6. The standard atmospheric conditions for testing and conditioning, especially the temperature, are replaced according to IEC 60212.
7. The circuit diagram of test apparatus is modified, and the structure diagram and pictures of test apparatus are added in Annex A.
8. The orders of part clauses are adjusted.

标准预览图