IEC 61967-8:2023 集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

标准编号：IEC 61967-8:2023

中文名称：集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

英文名称：Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

发布日期：2023-05-03

标准范围

IEC 61967-8:20 23作为IEC 61967-8:20 23 RLV提供，其中包含国际标准及其红线版本，显示了与上一版本相比技术内容的所有变化。IEC 61967-8:20 23定义了一种使用IC带状线测量集成电路(IC)电磁辐射发射的方法。被评估的IC安装在有源导体和IC带状线布置的接地平面之间的EMC测试板(PCB)上。与上一版相比，此版本包括以下重大技术变更:a)从范围中删除150 kHz至3 GHz的频率范围；b)只要满足定义的要求，将上可用频率扩展到6GHz或更高。

IEC 61967-8:2023 is available as IEC 61967-8:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 3 GHz was deleted from the scope;
b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.

标准预览图