IEC 60512-28-100:2019 电气和电子设备用连接器.试验和测量.第28-100部分:2000兆赫以下的信号完整性试验.试验28a至28g

标准编号：IEC 60512-28-100:2019

中文名称：电气和电子设备用连接器.试验和测量.第28-100部分:2000兆赫以下的信号完整性试验.试验28a至28g

英文名称：Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28g

发布日期：2019-11-15

标准范围

IEC 60512-28-100:2019作为IEC 60512-28-100:2019 RLV提供，其中包含国际标准及其红线版本，显示了与上一版本相比技术内容的所有变化。IEC 60512-28-100:2019规定了IEC 60603-7、IEC 61076-1、IEC 61076-2和IEC 61076-3标准各自部分中规定的连接器的信号完整性和传输性能测试方法，用于连接高达2 000 MHz的硬件应用。它也适用于测试低频连接器，但是，任何给定连接器的详细规范中规定的测试方法仍然是该连接器的参考一致性测试。上述连接器系列标准列表不排除在其他连接器制造商的规范或公布的标准中引用本文档。本文提供的测试程序是:-插入损耗，测试28a；-回波损耗，测试28b；-近端串扰(下一个)测试28c；-远端串扰(FEXT)，测试28d；-横向转换损耗(TCL)，测试28f；-横向转换传递损失(TCTL)，测试28g。本文引用的其他测试程序是:-传输阻抗（ZT），参见IEC 60512-26-100，测试26e。-关于耦合衰减（aC），参见IEC 62153 4 12。第二版取消并取代2013年发布的第一版，构成技术修订。与上一版相比，此版本包括以下重大技术变更:-标题从1 000 MHz修订为2 000 MHz，以反映可测试的频率范围。-所有表格和要求均已修订至2 000 MHz。关键词:连接器，信号完整性测试

IEC 60512-28-100:2019 is available as IEC 60512-28-100:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60512-28-100:2019 specifies the test methods for signal integrity and transmission performance for connectors specified in respective parts of IEC 60603-7, IEC 61076-1, IEC 61076-2, and IEC 61076-3 standards for connecting hardware applications up to 2 000 MHz. It is also suitable for testing lower frequency connectors, however, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector. The above list of connector series of standards does not preclude referencing this document in other connector manufacturer’s specifications or published standards. Test procedures provided herein are:
- insertion loss, test 28a;
- return loss, test 28b;
- near-end crosstalk (NEXT) test 28c;
- far-end crosstalk (FEXT), test 28d;
- transverse conversion loss (TCL), test 28f;
- transverse conversion transfer loss (TCTL), test 28g.
Other test procedures referenced herein are:
- transfer impedance (ZT), see IEC 60512-26-100, test 26e.
- for coupling attenuation (aC), see IEC 62153 4 12.
This second edition cancels and replaces the first edition, issued in 2013, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- The title is revised from 1 000 MHz to 2 000 MHz to reflect the range of frequencies which may be tested.
- All tables and requirements have been revised up to 2 000 MHz.
Key words: Connectors, Signal Integrity Tests

标准预览图