IEC 60793-1-43:2015 光纤.第1-43部分:测量方法和试验程序.数值孔径测量

标准编号：IEC 60793-1-43:2015

中文名称：光纤.第1-43部分:测量方法和试验程序.数值孔径测量

英文名称：Optical fibres - Part 1-43: Measurement methods and test procedures - Numerical aperture measurement

发布日期：2015-03-27

标准范围

IEC 60793-1-43:2015建立了测量光纤数值孔径的统一要求，从而有助于检查用于商业目的的光纤和电缆。A1、A2、A3和A4类多模光纤的数值孔径（NA）是描述光纤聚光能力的重要参数。它用于预测发射效率、接头处的接头损失和微观/宏观弯曲性能。通过测量远场图案(NAff)来定义数值孔径。在一些情况下，文献中使用理论数值孔径(NAth)，其可以通过测量纤芯和包层之间的折射率差来确定。理想情况下，这两种方法应该产生相同的值。IEC 60793第二版-1-43与IEC 60793-4X系列中的其他标准一起，取消并取代了2001年发布的IEC 60793-1-43第一版，并构成技术修订。与上一版相比，此版本包括以下重大技术变更:-扩大范围以包括A1、A2、A3和A4多模光纤类别；-增加样品长度和阈值的测量参数，产品特定于现在在产品规格中找到的变量；-一个新的附件B，题为"NA测量的产品特定默认值"；-增加用于测量A4d纤维的NA的新技术4；-题为“将NA测量值映射到替代长度”的新附件A，该附件提供了将较短样品长度测量值与参考测试方法Naff中建议的长度相关联的映射函数。关键词:光纤数值孔径，光纤光缆检测本出版物应与IEC 60793-1-1:20 08、IEC 60793-1-21:20 01和IEC 60793-1-22:20 01一起阅读。

IEC 60793-1-43:2015 establishes uniform requirements for measuring the numerical aperture of optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. The numerical aperture (NA) of categories A1, A2, A3 and A4 multimode fibre is an important parameter that describes a fibre's light-gathering ability. It is used to predict launching efficiency, joint loss at splices, and micro/macrobending performance. The numerical aperture is defined by measuring the far-field pattern (NAff). In some cases the theoretical numerical aperture (NAth) is used in the literature, which can be determined from measuring the difference in refractive indexes between the core and cladding. Ideally these two methods should produce the same value. This second edition of IEC 60793-1-43, together with other standards in the IEC 60793-4X series, cancels and replaces the first edition of IEC 60793-1-43, published in 2001, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- expansion of the scope to include A1, A2, A3 and A4 multimode fibre categories;
- addition of measurement parameters of sample length and threshold values, product specific to the variables that are now found in the product specifications;
- a new Annex B entitled "Product specific default values for NA measurement";
- addition of a new Technique 4 for measuring NA of A4d fibres;
- a new Annex A entitled "Mapping NA measurement to alternative lengths" that gives a mapping function to correlate shorter sample length measurements to the length suggested in the reference test method Naff. Keywords: numerical aperture of optical fibre, inspection of fibres and cables
This publication is to be read in conjunction with IEC 60793-1-1:2008, IEC 60793-1-21:2001 and IEC 60793-1-22:2001.

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