IEC 61967-4:2021 集成电路电磁发射测量第4部分:1欧姆/150欧姆直接耦合法测量传导发射

标准编号:IEC 61967-4:2021

中文名称:集成电路电磁发射测量第4部分:1欧姆/150欧姆直接耦合法测量传导发射

英文名称:Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

发布日期:2021-03-16

标准范围

IEC 61967-4:20 21作为IEC 61967-4:20 21 RLV提供,其中包含国际标准及其红线版本,显示了与上一版本相比技术内容的所有变化。IEC 61967-4:20 21规定了一种方法通过使用1 Ω电阻探头直接射频(RF)电流测量和使用150?耦合网络。这些方法确保了EME测量结果的高度再现性和相关性。与上一版相比,此版本包括以下重大技术变更:-从标题中删除了150 kHz至1 GHz的频率范围;-1的推荐频率范围?方法已降低到30 MHz;-增加了附件G,其中载有将频率范围扩展到1 GHz以上的建议和准则。

IEC 61967-4:2021 is available as IEC 61967-4:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150?coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition:
- frequency range of 150 kHz to 1 GHz has been deleted from the title;
- recommended frequency range for 1?method has been reduced to 30 MHz;
- Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.

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