IEC 60749-13:2018 半导体器件 - 机械和气候测试方法 - 第13部分:盐气氛

标准编号：IEC 60749-13:2018

中文名称：半导体器件 - 机械和气候测试方法 - 第13部分:盐气氛

英文名称：Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

发布日期：2018-02-15

标准范围

IEC？60749-13:20 18描述了确定半导体器件耐腐蚀性的盐气氛测试。这是一项加速测试，模拟恶劣的海岸大气对所有暴露表面的影响。它仅适用于那些为海洋环境指定的设备。？盐气氛试验被认为是破坏性的。与上一版相比，此版本包括以下重大技术变更:a）与MIL-STD-883J方法1009.8盐气氛（腐蚀）的一致性，包括关于试验箱的调节和维护以及试样安装的信息（包括说明图）。

IEC？60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.？The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

标准预览图