ISO/TS 11888:2017 纳米技术 多层碳纳米管的描述 介观形状因子

标准编号：ISO/TS 11888:2017

中文名称：纳米技术 多层碳纳米管的描述 介观形状因子

英文名称：Nanotechnologies — Characterization of multiwall carbon nanotubes — Mesoscopic shape factors

发布日期：2017-07

标准范围

ISO/TS 11888:2017描述了多壁碳纳米管（MWCNT）介观形状因子的表征方法。所采用的技术包括扫描电子显微镜（SEM）、透射电子显微镜（TEM）、粘度计和光散射分析。ISO/TS 11888:2017还包括定义静态弯曲持久性长度（SBPL）特征所需的附加术语。给出了评估SBPL的测量方法，SBPL通常从几十纳米到几百微米不等。与聚合物物理类似，多壁碳纳米管的介观形状因子的定义采用了成熟的概念和数学表达式。

ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM), transmission electron microscopy (TEM), viscometry, and light scattering analysis.ISO/TS 11888:2017 also includes additional terms needed to define the characterization of static bending persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally varies from several tens of nanometres to several hundred micrometres.Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

标准预览图