ISO 25297-1:2010 光学和光子学 光学数据的电子交换 第1部分：中性光学数据交换格式（NODIF）信息模型

标准编号：ISO 25297-1:2010

中文名称：光学和光子学 光学数据的电子交换 第1部分：中性光学数据交换格式（NODIF）信息模型

英文名称：Optics and photonics — Electronic exchange of optical data — Part 1: NODIF information model

发布日期：2010-08

标准范围

ISO 25297-1:20 10规定了光学系统和零件的信息要求，并提供了一个信息模型，以支持使用计算机进行CAD和CAE时这些光学系统和零件的光学设计、光学评估和分析过程。该信息模型添加了基于ISO 10303 STEP的光学设计规范特有的数据（所有部件）。附加信息是产品规格信息、光学设计信息、光学评价信息和分析信息。ISO 25297-1:20 10一般称为中性光学数据交换格式（NODIF）。以下内容在范围内:关于产品规格、光学设计、光学评估和分析的信息；成像系统中的光学系统和零件，如照相机和复印机、望远镜和显微镜的观察系统以及其他光学系统，如投影仪和拾取器-向上透镜；多配置光学系统，包括变焦镜头和内聚焦系统；光路定义，包括光路序列和光学表面布置；光学组件，包括胶合部件和动态部件；光学表面形式的数学描述；衍射表面的描述；机械加工工艺名称，例如抛光、成型或复制；光学材料规格，如材料名称、批号和测量的折射率；每个光学部件的形状和材料特性的光学公差；装配公差，如分离度、平行度、位移和倾斜；有效直径、涂层和保护性表面处理；近轴评价，如焦距、后焦距、主点和f-号码；光线跟踪评估，例如几何光线跟踪结果（即，每个表面上的光线方向和交点以及光路长度）、像差和波前像差；基于几何和/或物理光学的OTF评估；检测表面或投影表面上的照度分布；光谱特性；重影图像评估；伴随光学表面变形和材料特性值变化的热分析；伴随光学表面变形和材料特性值变化的应力分析；遮蔽眩光和表面缺陷。以下不属于ISO 25297本部分的范围:机械设计、电子设计和嵌入式软件设计；光路可变的光学系统，例如。g.分束器或可变放大率转换器；机械零件的公差；直径小于光波长10倍的零件；由介电常数σ、介电常数ε和介电常数μ不受材料和光之间相互作用影响的材料制成的部件；产品设计、评估和分析产生的图形文档；用于光通信的光波导；有关市场研究和客户分析的产品规划信息；与设计、评估和分析无关的产品定义和配置控制信息；分析信息，热和应力分析除外，例如振动分析；试生产、生产过程（包括生产计划和生产控制）以及生产后过程（如装运和维修）的信息；和眼科光学。

ISO 25297-1:2010 specifies the information requirements for optical systems and parts, and provides an information model to support the processes of optical design, optical evaluation and analysis for these optical systems and parts when using computers with CAD and CAE.This information model adds the data peculiar to optical design specification based on STEP to ISO 10303 (all parts). The additional information is product specification information, optical design information, optical evaluation information and analysis information.ISO 25297-1:2010 is generically called the Neutral Optical Data Interchange Format (NODIF).The following are within the scope: information on product specification, optical design, optical evaluation and analysis; optical systems and parts in imaging systems, such as cameras and copiers, viewing systems for telescopes and microscopes and the other optical systems, such as projectors and pick-up lenses; multiple-configuration optical systems, including zoom lenses and inner focusing systems; optical path definition, including ray-path sequence and optical surface arrangement; optical assemblies, including cemented parts and dynamic parts; mathematical description of the optical surface form; description of diffractive surfaces; machining process designation, such as polishing, moulding or replicating; optical material specifications, such as material names, lot numbers and measured refractive indices; optical tolerances for the shape and material property of each optical part; assembly tolerances, such as separation, parallelism, displacement and tilt; effective diameters, coatings and protective surface treatment; paraxial evaluation, such as focal length, back focal length, principal points and f-number; ray-tracing evaluation, such as geometrical ray-tracing results (i.e. ray directions and intersection points on each surface and optical path lengths), aberrations and wavefront aberration; OTF evaluation based on geometrical and/or physical optics; illuminance distribution on a detection surface or a projection surface; spectral characteristics; ghost image evaluation; thermal analysis accompanying optical surface deformation and material property value change; stress analysis accompanying optical surface deformation and material property value change; and veiling glare and surface imperfections.The following are outside the scope of this part of ISO 25297: mechanical design, electronic design and embedded software design; optical systems in which the optical path is changeable, e.g. beam splitters or variable magnification converters; tolerances for mechanical parts; parts with a diameter less than 10 times the wavelength of light; parts made from materials whose dielectric constant, σ, electric permittivity, ε, and magnetic permittivity, μ, are uninfluenced by interaction between the materials and the light; graphical documents resulting from design, evaluation and analysis of products; optical wave guide for optical communications; product planning information concerning market research and customer analysis; product definition and configuration control information irrelevant to design, evaluation and analysis; analysis information, except thermal and stress analysis, e.g. vibration analysis; information on trial production, production process including production planning and production control, and processes after production, such as shipment and repair; and ophthalmic optics.

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