ISO/TR 17055:2002 钢-硅含量测定-感应成对等离子体微粒光谱法

标准编号：ISO/TR 17055:2002

中文名称：钢-硅含量测定-感应成对等离子体微粒光谱法

英文名称：Steel — Determination of silicon content — Inductively coupled plasma atomic emission spectrometric method

发布日期：2002-04

标准范围

ISO/TR 17055规定了通过电感耦合等离子体发射光谱法测定钢中硅含量的方法。该方法适用于质量分数为0.02%至5%的硅含量。该方法使用基于校准溶液与样品非常接近的矩阵匹配的校准，并将待分析样品中硅的近似浓度附近的内容物紧密包围起来。因此，样品中所有元素的浓度大致已知。如果浓度未知，则必须通过某种半定量方法对样品进行分析。

ISO/TR 17055 specifies a method for the determination of the content of silicon in steel by means of inductively coupled plasma emission spectrometry. The method is applicable to silicon contents of mass fraction 0,02 % to 5 %.The method uses a calibration based on a very close matrix matching of the calibration solutions to the sample and close bracketing of the contents around the approximate concentration of silicon in the sample to be analysed. The concentrations of all elements in the sample has, therefore, to be approximately known. If the concentrations are not known the sample has to be analysed by some semi quantitative method.

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