ISO 9220:1988 金属镀层.镀层厚度的测量.扫描电子显微镜法

标准编号：ISO 9220:1988

中文名称：金属镀层.镀层厚度的测量.扫描电子显微镜法

英文名称：Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

发布日期：1988-10

标准范围

规定了通过扫描电子显微镜检查横截面来测量金属涂层局部厚度的方法。它具有破坏性，不确定性小于10%或0,1/um，以较大者为准。它可以用于厚度高达几毫米的显微镜，但通常更实用的是使用LIGHT显微镜（ISO 1463）。附录a给出了横截面的准备。

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

标准预览图