GB/T 1553-1997 硅和锗体内少数载流子寿命测定光电导衰减法

标准编号：GB/T 1553-1997

标准名称：硅和锗体内少数载流子寿命测定光电导衰减法

英文名称：Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay