ISO/IEC 10373-3:2018 识别卡 试验方法 第3部分：带有触点和相关集成装置的集成电路卡

标准编号：ISO/IEC 10373-3:2018

中文名称：识别卡 试验方法 第3部分：带有触点和相关集成装置的集成电路卡

英文名称：Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices

发布日期：2018-09

标准范围

ISO/IEC 10373-3:20 18本文件根据ISO/IEC 7816-3中给出的定义，定义了带触点的集成电路卡和相关接口设备特性的测试方法。每种测试方法都是交叉的？参考一个或多个基本标准，其可以是定义在识别卡应用中采用的信息存储技术的ISO/IEC 7810。注:可接受性标准不构成本文件的一部分，但可在上述国际标准中找到。本文件定义了特定于带触点的集成电路技术的测试方法。ISO/IEC 10373-1定义了一种或多种卡技术通用的测试方法，ISO/IEC 10373系列的其他部分定义了其他技术？具体测试。本文件中定义的试验方法旨在单独和独立地进行。给定的卡不需要顺序地通过所有测试。本文件中定义的测试方法基于ISO/IEC 7816-3。使用本文件中定义的测试方法确定的卡和IFD的一致性不排除现场失效。可靠性测试超出了本文档的范围。本文档没有定义任何测试来建立集成电路卡的完整功能。测试方法仅要求验证最小功能。最小功能定义如下。-存在于卡中的任何集成电路继续显示符合基本标准的复位响应。-与卡中存在的任何集成电路相关联的任何触点继续显示符合基本标准的电阻。

ISO/IEC 10373-3:2018 This document defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816-3. Each test method is cross？referenced to one or more base standards, which can be ISO/IEC 7810 that defines the information storage technologies employed in identification card applications.
NOTE Criteria for acceptability do not form part of this document but can be found in the International Standards mentioned above.
This document defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts of the ISO/IEC 10373 series define other technology？specific tests.
Test methods defined in this document are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in this document are based on ISO/IEC 7816-3.
Conformance of cards and IFDs determined using the test methods defined in this document does not preclude failures in the field. Reliability testing is outside the scope of this document.
This document does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. The minimum functionality is defined as follows.
- Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard.
- Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.

标准预览图