ISO 10110-7:2008 光学和光子学 光学元件和系统的制图准备 第7部分：表面缺陷公差

标准编号：ISO 10110-7:2008

中文名称：光学和光子学 光学元件和系统的制图准备 第7部分：表面缺陷公差

英文名称：Optics and photonics — Preparation of drawings for optical elements and systems — Part 7: Surface imperfection tolerances

发布日期：2008-02

标准范围

ISO 10110-7:2008规定了单个光学元件和光学组件有效孔径内表面缺陷可接受程度的指示。这些缺陷包括局部表面缺陷、边缘缺口和长划痕。ISO 10110-7:2008适用于成品光学元件的透射面和反射面，无论其是否有涂层，以及光学组件。它承认，可根据部件或光学组件上缺陷影响的区域规定允许的缺陷。

ISO 10110-7:2008 specifies the indication of the level of acceptability of surface imperfections within the effective aperture of individual optical elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches.ISO 10110-7:2008 applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It recognizes that permissible imperfections may be specified according to the area affected by imperfections on components or in optical assemblies.

标准预览图