ISO 18117:2009 表面化学分析 分析前样品的处理

标准编号：ISO 18117:2009

中文名称：表面化学分析 分析前样品的处理

英文名称：Surface chemical analysis — Handling of specimens prior to analysis

发布日期：2009-03

标准范围

ISO 18117:2009对提交用于表面化学分析的样品的处理和容器提供了指导。它旨在帮助表面分析服务的用户了解表面化学分析技术的特殊样品处理要求，特别是以下技术:俄歇电子能谱（AES）、二次离子质谱（SIMS）和X射线光电子能谱（XPS或ESCA）。所提出的方案也可适用于对表面组成敏感的其他分析技术，例如TXRF。在特定情况下，对于特定样本，可能需要进一步的预防措施。

ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.

标准预览图