ISO 20903:2019 表面化学分析 俄歇电子能谱法和X射线光电子能谱法 峰强度测定方法及报告结果所需信息

标准编号：ISO 20903:2019

中文名称：表面化学分析 俄歇电子能谱法和X射线光电子能谱法 峰强度测定方法及报告结果所需信息

英文名称：Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results

发布日期：2019-02

标准范围

本文件规定了基于俄歇电子和X射线光电子能谱峰值强度测量的分析结果报告中所需的必要信息。还提供了有关峰值强度测量方法和衍生峰面积不确定性的信息。

This document specifies the necessary information required in a report of analytical results based on measurements of the intensities of peaks in Auger electron and X-ray photoelectron spectra. Information on methods for the measurement of peak intensities and on uncertainties of derived peak areas is also provided.

标准预览图