ISO/IEC 10373-3:2010 识别卡 试验方法 第3部分：带有触点和相关集成装置的集成电路卡

标准编号：ISO/IEC 10373-3:2010

中文名称：识别卡 试验方法 第3部分：带有触点和相关集成装置的集成电路卡

英文名称：Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices

发布日期：2010-10

标准范围

ISO/IEC 10373-3:20 10根据ISO/IEC 7816中给出的定义，定义了具有触点和相关接口设备的集成电路卡特性的测试方法。每种测试方法都与一个或多个基本标准交叉引用，这些标准可以是ISO/IEC 7810或一个或多个定义识别卡应用中使用的信息存储技术的补充国际标准。ISO/IEC 10373-3:20 10定义了特定于带触点的集成电路技术的测试方法。ISO/IEC 10373-1定义了一种或多种卡技术通用的测试方法，其他部分定义了其他特定于技术的测试。ISO/IEC 10373-3:20 10中定义的试验方法旨在单独和独立地进行。给定的卡不需要顺序地通过所有测试。ISO/IEC 10373-3:20 10中定义的测试方法基于ISO/IEC 7816-3。使用ISO/IEC 10373-3:20 10中定义的测试方法确定的卡和IFD的一致性不排除现场失效。可靠性测试超出了ISO/IEC 10373-3:20 10的范围。ISO/IEC 10373-3:20 10没有定义任何测试来建立集成电路卡的完整功能。测试方法仅要求验证最小功能。最小功能定义如下。卡中存在的任何集成电路继续显示符合基本标准的复位响应。与存在于卡中的任何集成电路相关联的任何触点继续显示符合基本标准的电阻。

ISO/IEC 10373-3:2010 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary International Standards that define the information storage technologies employed in identification card applications.

ISO/IEC 10373-3:2010 defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts define other technology‑specific tests.

Test methods defined in ISO/IEC 10373-3:2010 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in ISO/IEC 10373-3:2010 are based on ISO/IEC 7816-3.

Conformance of cards and IFDs determined using the test methods defined in ISO/IEC 10373-3:2010 does not preclude failures in the field. Reliability testing is outside the scope of ISO/IEC 10373-3:2010.

ISO/IEC 10373-3:2010 does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. Minimum functionality is defined as follows.

• Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard.


• Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.

标准预览图