ISO/TS 10867:2019 纳米技术 近红外光致发光谱法表征单壁碳纳米管

标准编号：ISO/TS 10867:2019

中文名称：纳米技术 近红外光致发光谱法表征单壁碳纳米管

英文名称：Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

发布日期：2019-12

标准范围

本文件给出了使用近红外（NIR）光致发光（PL）光谱表征单壁碳纳米管（SWCNT）的指南。它为测定样品中半导体单壁碳纳米管的手性指数及其相对积分发光强度提供了一种测量方法。该方法可以扩展到根据测量的集成光致发光强度和光致发光截面知识估算样品中半导体单壁碳纳米管的相对质量浓度。

This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

标准预览图