ISO 10110-8:2010 光学和光学仪器 光学元件和系统制图 第8部分：表面结构；光洁度和波纹度

标准编号：ISO 10110-8:2010

中文名称：光学和光学仪器 光学元件和系统制图 第8部分：表面结构；光洁度和波纹度

英文名称：Optics and photonics — Preparation of drawings for optical elements and systems — Part 8: Surface texture; roughness and waviness

发布日期：2010-10

标准范围

ISO 10110规定了用于制造和检验的技术图纸中光学元件的设计和功能要求。ISO 10110的本部分规定了光学元件表面纹理的指示规则。表面纹理是可以用统计方法有效描述的表面特征。通常，表面纹理与高空间频率误差（粗糙度）和中空间频率误差（波纹度）有关。ISO 10110的本部分主要用于抛光光学元件的规范。ISO 10110的这一部分描述了通过减去表面形状来表征去除趋势后剩余表面的方法。

ISO 10110 specifies the presentation of design and functional requirements for optical elements in technical drawings used for manufacturing and inspection.This part of ISO 10110 specifies rules for the indication of the surface texture of optical elements. Surface texture is the characteristic of a surface that can be effectively described with statistical methods. Typically, surface texture is associated with high spatial frequency errors (roughness) and mid-spatial frequency errors (waviness).This part of ISO 10110 is primarily intended for the specification of polished optics.This part of ISO 10110 describes a method for characterizing the residual surface that is left after detrending by subtracting the surface form.

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